Икс рей габариты: LADA XRAY – Технические характеристики – Официальный сайт LADA

Габаритные размеры Лада х рей Кросс: кузов, колеса, диски

После выхода Лада X-Рей Кросс водители по всей России стали интересоваться новинкой. Отчасти такое любопытство связано с желанием пересесть на кроссовер повышенной проходимости. Кроме клиренса еще важными моментами отмечаются габариты и размеры кузова, а также его отдельных элементов. Рассмотрим LADA XRAY Cross подробнее: кузов, салон, диски и багажник.

Размер кузова

Габаритные размеры Лада X-Рей Кросс можно с уверенностью назвать достойными. Тут при желании сзади смогут разместиться с комфортом не только дети, но и взрослые. Стоит отдать должное «АвтоВАЗу», которому еще удается держаться на «плаву» выпуская конкурентоспособную продукцию.

Основные параметры кузова LADA XRAY Cross:

• количество дверей: 5 штук;
• длина: 4171 мм;
• ширина, включая зеркала: 1983 мм;
• высота с антенной: 1645 мм;
• база классическая: 2592 мм.

Ширина без зеркал 1810 мм. Хотя учитывать правильнее с ними, ведь часто показатель ширины важен при маневрах между другими автомобилями. Размер салона отыгрывает второстепенную роль, которая критична только семейным водителям. Холостякам нет необходимости делить салон с большим количеством людей.

Высота подросла по сравнению с обычным XRAY на +75 мм. Внушительный показатель с учетом сохранения цены доступной большинству россиян. Вообще везде по сравнению с обычным кроссовером отмечаются увеличения в кузове: ширина +46 мм, а длина +6 мм.

Габариты и размеры Лада X-Рей Кросс конкурируют с большинством аналогичных кроссоверов. Касательно калии спереди у автомобиля 1503 мм, сзади – 1546 мм. Тут же невозможно не оценить выдающийся клиренс – 215 мм. Кроссовер с таким дорожным просветом легко даст фору многим:

• Renault Duster: 210 мм;
• Lada 4×4: 205 мм;
• Nissan X-trail: 210 мм.

Именно клиренс на LADA XRAY Cross ставит точку в решении о покупке автомобиля. Приставка «Cross» оправдывается дорожным просветом в 215 мм.

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Автолюбители и просто покупатели всегда пытаются сравнивать модели разных транспортных средств между собой. Это…

 

Все автомобилисты, купившие кроссовер, отмечают практичность такого показателя. Для жизни за городом или любителям рыбалки стоит в первую очередь рассматривать отечественный автомобиль к покупке.

За дорожный просвет отвечают пружинные подвески: спереди независимая, а сзади полузависимая. Амортизаторы гарантируют сохранение максимально высокого клиренса как можно дольше.

Интерьер, двигатель и колеса

Размер багажника в стандартном положении кресел 361 л. Немного больше вас порадует максимальный его объем: 1514 л. Грузовые перевозки вполне можно выполнять на данном кроссовере. При этом потребуется сложить все сиденья, включая место пассажира воле водителя. Если ограничится только вторым рядом сидений, тогда придется довольствоваться 1207 л.

Учитывая направленность Лада X-Рей Кросс в сторону увеличения проходимости, багажник выглядит вполне приличным. Большинству жителей города 361 л хватит для поездок в магазин и на работу. Другое дело сельским жителям стремящихся приобрести транспорт для перевозки овощей – LADA XRAY Cross немного другой вид транспорта.

Размер дисков: 215/50 R17 (91, H). С учетом широких арок колеса на R17 смотрятся едино с кроссовером. Большинству водителей нет необходимости даже пробовать вместить большего диаметра колеса, которые могут показаться уже перебором. Это тот случай, когда с завода выпускают ваш автомобиль без изъянов в экстерьере, где каждый элемент уже продуман.

От передних колес к краю кузова 835 мм. Задние покажут 744 мм. С таким расположением колес кроссовер хорошо себя чувствует на трассе. Рискованных кренов на поворотах водитель не почувствует.

Размер колес для клиренса 215 мм подобран идеально. Такое сочетание допускает нагружать автомобиль до отметки в 1650 кг. При этом сохранится относительно неплохой дорожный просвет для преодоления основных ям на вполне новом асфальте. Бак объемом на 50 л.

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Тест драйв Lada xRay: вездеход с задатками кроссовера
Новинка АвтоВАЗа Лада х Рей стала небольшой революцией для производителя. С момента выхода на рынок она завоевала…

 

Двигатель только один на 1.8 л. Клапанов 16. Его расположение переднее поперечное. Единственная коробка передач 5МТ. Она также отыгрывает не последнюю роль в некоторых характеристиках кроссовера. Отсутствие автомата не позволяет рассмотреть автомобиль во всех его вариациях, что снижает потребительский интерес.

Загляните в нашу группу Вконтакте.

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90000 90001 Desktop X-Ray Orientation Machine for Single Crystal Orientation Measurement 90002 90003 90004 90005 90003 90007 90003 90009 90005 90003 90000 90005 90003 90015 90016 90007 90018 90019 90007 90003 90022 In stock 90023 90022 Item Number: DX100G 90023 90007 90018 90005 90029 90022 The EQ-DX-100G is a desktop X-Ray diffractometer used for analyzing the orientation of all single crystal types in two-theta angles from 10 ° — 140 °.The built-in single wavelength filter ensures the emission of a monochromatic X-Ray wavelength (Kα) with +/- 15 «angle accuracy. Designed with precision and compactness in mind, this desktop X-Ray machine provides the ideal solution for crystal research labs, substrate manufacturers, and wafer quality control facilities. 90023 90032 Specifications: 90033 90034 90035 90005 90003 90022 Features 90023 90007 90003 90042 90043 Simple Operation: With an understanding of Bragg’s law, an individual can learn the machine operation within minutes 90044 90043 Precision: Crystal orientation can be determined accurately within +/- 15 «(0.0046 °) 90044 90043 Safety: Low X-Ray emission, automatic shutter and lead foil cover reduce exposure to radiation 90044 90043 Cost Effective: Features comparable to more expensive X-Ray diffractometers 90044 90051 90007 90018 90005 90003 90022 90032 90033 Power Supply / Power 90016 90023 90007 90003 90042 90043 Input AC 208 — 240V, 50Hz / 60Hz, 250W (The power plug is NOT included) 90044 90043 For 110V, 500W Transformer is required for this diffractometer 90044 90043 The high voltage power supply is a discrete unit along with the diffractometer 90044 90043 90032 90072 90033 90016 90044 90051 90007 90018 90005 90003 90022 X-Ray Tube 90023 90007 90003 90042 90043 Cu target, air cooling, Cu-Kα output 90044 90043 90089 90090 X-Ray tube with a monochromatic wave (Kα) filter improves accuracy 90044 90043 Scintillation detector reduces harmful X-Ray radiations 90044 90043 X-Ray tube is a consumable part with 2 years warranty.The additional X-ray tube is available (See Table 90032 Standard Package of Machine 90033 below for price) 90044 90051 90099 90100 90016 90032 90032 90033 Monochromatic Filter 90033 90032 Scintillation Tube 90016 90033 90007 90018 90005 90003 90022 Max. Tube Current 90023 90007 90003 90022 5 mA at 35kV 90023 90007 90018 90005 90003 90022 X-Ray Detector 90023 90007 90003 90022 Max.Voltage at 1050V 90023 90007 90018 90005 90003 90022 Measure Range 90016 90135 90032 90016 Graduated Platform 90033 90023 90007 90003 90022 90016 2 Theta: 10 ° ~ 140 °, Theta: 10 ° ~ 70 ° 90016 90016 90032 90032 90033 90016 90033 90023 90007 90018 90005 90003 90022 Accuracy 90023 90007 90003 90022 Digital display with measurement accurate within +/- 15 «(0.0046 °) 90023 90007 90018 90005 90003 90022 Sample Holder 90023 90007 90003 90042 90043 One spring load wafer holder is included for holding a flat wafer or substrate smaller than 2 «(See Fig.1 Fig.2) 90044 90043 One ceramic vacuum suction plate is included for holding a flat wafer or substrate larger than 2 «(See Fig.3 Fig.4) 90044 90043 A 6mm OD tube is required for the compression fitting on the back of the vacuum suction plate (See Fig.3) 90044 90051 90178 90016 90032 Fig.1 Substrate Sample Holder Fig.2 Mounting Substrate Fig.3 Vaccum Suction Plate 90033 90032 Fig.4 Large Wafer Example with Pump 90033 90032 90033 90007 90018 90005 90003 90022 Optional Parts 90023 90007 90003 90194 90195 90016 90032 Vacuum Pump 90032 Boule Holder 90033 90032 90033 90032 with Sample 90016 90033 90033 90007 90018 90005 90003 90022 Radiation Protection 90023 90007 90003 90042 90043 Built-in automatic shutter prevents operation with the cover opened 90044 90043 Lead foil reinforced plastic cover reduces radiation leaking 90044 90043 Warning: The cover must be 90032 CLOSED 90033 during operation 90044 90043 A high accuracy digital Geiger counter (or dosimeter.See picture below) is included for monitoring the radiation 90044 90042 90043 High accuracy measurement with 0.05 — 9.99 uSv / h detection range 90044 90043 Audio and vibration high level alarm modes are available 90044 90051 90043 The radiation level outside of the operating unit is measured as 0.07 uSv / h, which is the same as the background level, indicating good radiation protection from the unit 90044 90051 90032 high accuracy dosimeter 90033 90032 safe radiation level outside the operating unit 90033 90007 90018 90005 90003 90022 Dimension of X-Ray Machine 90023 90007 90003 90022 500 x 650 x 400 mm (L x W x H) 90023 90007 90018 90005 90003 90022 Dimension of Power Supply Unit 90023 90007 90003 90022 500 x 500 x 500 mm 90023 90007 90018 90005 90003 90022 Net Weight 90023 90007 90003 90022 100 kg (220 lbs) 90023 90007 90018 90005 90003 Shipping Weight 90007 90003 150 kg (320 lbs) 90007 90018 90005 90003 Shipping Size 90007 90003 60 «x 45» x 35 «(1520 x 1150 x 900 mm) 90007 90018 90005 90003 Compliance 90007 90003 CE Certified 90007 90018 90005 90003 Operation Video & 90007 90003 90292 90016 90032 90295 90033 90007 90018 90005 90003 90022 Appending links for 90016 X-ray diffractometer 90023 90022 90032 90033 90023 90007 90003 90007 90018 90312 90019 90022 90032 90016 Standard Package of Machine: 90016 90033 90023 90022 90016 90032 Optional: 90016 90033 90023 90007 90018 90019 90007 90003 90331 90005 90018 90005 90003 90331 90005 90003 90007 90003 90007 90003 90007 90018 90005 90003 90007 90003 90022 Your cart is empty.90023 Please clear the browsing history before ordering the product. Otherwise, availability and price are not guaranteed. 90007 90003 90007 90018 90005 90003 90007 90003 90007 90003 90007 90018 90019 90007 90018 90019 90032 90032 90032 MTI sponsorships: 90032 90089 90016 MTI Sponsors Thermoelectrics Workshop 90016 90016 90032 90032 90032 90032 90089 90090 90033 90033 90033 90033 90032 90032 90032 90089 MTI-UCSD Battery Fabrication Lab 90090 90033 90033 90033 90090 90033 90033 90033 90033 90089 90032 MTI-VISTEC Cylindrical Cell Pilot Line 90033 90090 90016 90032 90089 90016 90090 90033 90032 90089 MTI Sponsors the Postdoctoral Awards 90016 90090 90033 90032 90016 Announcement: 90016 90033 MTI KJ Group Files Lawsuit Against Shangdong Gelon LIB Group for Copyright Infringement of MTI products and Manufacture & sale of counterfeit goods 90022 MTI and Celgard have successfully reached the settlement under court for the litigation on patent and trademark 90023 90032 90022 Upcoming Shows: 90023 90016 90033 90032 90016 90033 90427 90035 90005 90003 90007 90018 90312 90019 90016 90016 90007 90018 90019 90007 90019.90000 X-ray Powder Diffraction (XRD) 90001 90002 Barbara L Dutrow, Louisiana State University 90003, 90002 Christine M. Clark, Eastern Michigan University 90003 90006 What is X-ray Powder Diffraction (XRD) 90007 90002 X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.90003 90006 Fundamental Principles of X-ray Powder Diffraction (XRD) 90007 Max von Laue, in 1912 discovered that crystalline substances act as three-dimensional diffraction gratings for X-ray wavelengths similar to the spacing of planes in a crystal lattice. X-ray diffraction is now a common technique for the study of crystal structures and atomic spacing. 90002 X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample.The interaction of the incident rays with the sample produces constructive interference (and a diffracted ray) when conditions satisfy Bragg’s Law (90013 n 90014 λ = 2 90013 d 90014 sin θ). This law relates the wavelength of electromagnetic radiation to the diffraction angle and the lattice spacing in a crystalline sample. These diffracted X-rays are then detected, processed and counted. By scanning the sample through a range of 2θangles, all possible diffraction directions of the lattice should be attained due to the random orientation of the powdered material.Conversion of the diffraction peaks to d-spacings allows identification of the mineral because each mineral has a set of unique d-spacings. Typically, this is achieved by comparison of d-spacings with standard reference patterns. 90003 90002 All diffraction methods are based on generation of X-rays in an X-ray tube. These X-rays are directed at the sample, and the diffracted rays are collected. A key component of all diffraction is the angle between the incident and diffracted rays. Powder and single crystal diffraction vary in instrumentation beyond this.90003 90006 X-ray Powder Diffraction (XRD) Instrumentation — How Does It Work? 90007 X-ray diffractometers consist of three basic elements: an X-ray tube, a sample holder, and an X-ray detector. 90022 Bruker’s X-ray Diffraction D8-Discover instrument. Details X-rays are generated in a cathode ray tube by heating a filament to produce electrons, accelerating the electrons toward a target by applying a voltage, and bombarding the target material with electrons. When electrons have sufficient energy to dislodge inner shell electrons of the target material, characteristic X-ray spectra are produced.These spectra consist of several components, the most common being K 90023 α 90024 and K 90023 β 90024. K 90023 α 90024 consists, in part, of K 90023 α1 90024 and K 90023 α2 90024. K 90023 α1 90024 has a slightly shorter wavelength and twice the intensity as K 90023 α2 90024. The specific wavelengths are characteristic of the target material (Cu, Fe, Mo, Cr). Filtering, by foils or crystal monochrometers, is required to produce monochromatic X-rays needed for diffraction. K 90023 α1 90024 and K 90023 α2 90024 are sufficiently close in wavelength such that a weighted average of the two is used.Copper is the most common target material for single-crystal diffraction, with CuK 90023 α 90024 radiation = 1.5418Å. These X-rays are collimated and directed onto the sample. As the sample and detector are rotated, the intensity of the reflected X-rays is recorded. When the geometry of the incident X-rays impinging the sample satisfies the Bragg Equation, constructive interference occurs and a peak in intensity occurs. A detector records and processes this X-ray signal and converts the signal to a count rate which is then output to a device such as a printer or computer monitor.90043 X-ray powder diffractogram. Peak positions occur where the X-ray beam has been diffracted by the crystal lattice. The unique set of d-spacings derived from this patter can be used to ‘fingerprint’ the mineral. Details 90002 The geometry of an X-ray diffractometer is such that the sample rotates in the path of the collimated X-ray beam at an angle θ while the X-ray detector is mounted on an arm to collect the diffracted X-rays and rotates at an angle of 2θ. The instrument used to maintain the angle and rotate the sample is termed a 90013 goniometer 90014.For typical powder patterns, data is collected at 2θ from ~ 5 ° to 70 °, angles that are preset in the X-ray scan. 90003 90006 Applications 90007 X-ray powder diffraction is most widely used for the identification of unknown crystalline materials (e.g. minerals, inorganic compounds). Determination of unknown solids is critical to studies in geology, environmental science, material science, engineering and biology. 90002 Other applications include: 90003 90052 90053 characterization of crystalline materials 90054 90053 identification of fine-grained minerals such as clays and mixed layer clays that are difficult to determine optically 90054 90053 determination of unit cell dimensions 90054 90053 measurement of sample purity 90054 90061 With specialized techniques, XRD can be used to: 90052 90053 determine crystal structures using Rietveld refinement 90054 90053 determine of modal amounts of minerals (quantitative analysis) 90054 90053 characterize thin films samples by: 90054 90052 90053 determining lattice mismatch between film and substrate and to inferring stress and strain 90054 90053 determining dislocation density and quality of the film by rocking curve measurements 90054 90053 measuring superlattices in multilayered epitaxial structures 90054 90053 determining the thickness, roughness and density of the film using glancing incidence X-ray reflectivity measurements 90054 90061 90053 make textural measurements, such as the orientation of grains, in a polycrystalline sample 90054 90061 90006 Strengths and Limitations of X-ray Powder Diffraction (XRD)? 90007 90084 Strengths 90085 90052 90053 Powerful and rapid (<20 min) technique for identification of an unknown mineral 90054 90053 In most cases, it provides an unambiguous mineral determination 90054 90053 Minimal sample preparation is required 90054 90053 XRD units are widely available 90054 90053 Data interpretation is relatively straight forward 90054 90061 90084 Limitations 90085 90052 90053 Homogeneous and single phase material is best for identification of an unknown 90054 90053 Must have access to a standard reference file of inorganic compounds (d-spacings, 90013 hkl 90014 s) 90054 90053 Requires tenths of a gram of material which must be ground into a powder 90054 90053 For mixed materials, detection limit is ~ 2% of sample 90054 90053 For unit cell determinations, indexing of patterns for non-isometric crystal systems is complicated 90054 90053 Peak overlay may occur and worsens for high angle 'reflections' 90054 90061 90006 User's Guide - Sample Collection and Preparation 90007 90002 90013 Determination of an unknown requires: the material, an instrument for grinding, and a sample holder.90014 90003 90052 90053 Obtain a few tenths of a gram (or more) of the material, as pure as possible 90054 90053 Grind the sample to a fine powder, typically in a fluid to minimize inducing extra strain (surface energy) that can offset peak positions, and to randomize orientation. Powder less than ~ 10 μm (or 200-mesh) in size is preferred 90054 90053 Place into a sample holder or onto the sample surface: 90128 Packing of fine powder into a sample holder. Details 90052 90053 smear uniformly onto a glass slide, assuring a flat upper surface 90054 90053 pack into a sample container 90054 90053 sprinkle on double sticky tape 90054 90061 Typically the substrate is amorphous to avoid interference 90054 90053 Care must be taken to create a flat upper surface and to achieve a random distribution of lattice orientations unless creating an oriented smear.90054 90053 For analysis of clays which require a single orientation, specialized techniques for preparation of clay samples are given by USGS. 90054 90061 90053 For unit cell determinations, a small amount of a standard with known peak positions (that do not interfere with the sample) can be added and used to correct peak positions. 90054 90006 Data Collection, Results and Presentation 90007 90002 90148 Data Collection 90149 The intensity of diffracted X-rays is continuously recorded as the sample and detector rotate through their respective angles.A peak in intensity occurs when the mineral contains lattice planes with d-spacings appropriate to diffract X-rays at that value of θ. Although each peak consists of two separate reflections (Kα 90023 1 90024 and Kα 90023 2 90024), at small values ​​of 2θ the peak locations overlap with Kα 90023 2 90024 appearing as a hump on the side of Kα 90023 1 90024. Greater separation occurs at higher values ​​of θ. Typically these combined peaks are treated as one. The 2λ position of the diffraction peak is typically measured as the center of the peak at 80% peak height.90003 90148 Data Reduction 90149 90002 Results are commonly presented as peak positions at 2θ and X-ray counts (intensity) in the form of a table or an x-y plot (shown above). Intensity (90013 I 90014) is either reported as peak height intensity, that intensity above background, or as integrated intensity, the area under the peak. The relative intensity is recorded as the ratio of the peak intensity to that of the most intense peak (90013 relative intensity = I / I 90023 1 90024 x 100 90014).90003 90148 Determination of an Unknown 90149 90002 The d-spacing of each peak is then obtained by solution of the Bragg equation for the appropriate value of λ. Once all d-spacings have been determined, automated search / match routines compare the 90013 d 90014 s of the unknown to those of known materials. Because each mineral has a unique set of d-spacings, matching these d-spacings provides an identification of the unknown sample. A systematic procedure is used by ordering the d-spacings in terms of their intensity beginning with the most intense peak.Files of d-spacings for hundreds of thousands of inorganic compounds are available from the International Centre for Diffraction Data as the Powder Diffraction File (PDF). Many other sites contain d-spacings of minerals such as the American Mineralogist Crystal Structure Database. Commonly this information is an integral portion of the software that comes with the instrumentation. 90003 90148 Determination of Unit Cell Dimensions 90149 90002 For determination of unit cell parameters, each reflection must be indexed to a specific 90013 hkl 90014.90003 90006 Literature 90007 90002 The following literature can be used to further explore X-ray Powder Diffraction (XRD) 90003 90052 90053 Bish, DL and Post, JE, editors. 1989. Modern Powder Diffraction. Reviews in Mienralogy, v. 20. Mineralogical Society of America. 90054 90053 Cullity, B. D. 1978. Elements of X-ray diffraction. 2nd ed. Addison-Wesley, Reading, Mass. 90054 90053 Klug, H. P., and L. E. Alexander. 1974. X-ray diffraction procedures for polycrystalline and amorphous materials.2nd ed. Wiley, New York. 90054 90053 Moore, D. M. and R. C. Reynolds, Jr. 1997. X-Ray diffraction and the identification and analysis of clay minerals. 2nd Ed. Oxford University Press, New York. 90054 90061 90006 Related Links 90007 90002 For more information about X-ray Powder Diffraction (XRD) follow the links below. 90003 90006 Teaching Activities and Resources 90007 90002 Teaching activities, labs, and resources pertaining to X-ray Powder Diffraction (XRD). 90003 90052 90053 X-ray techniques lab exercises from the SERC Teaching Mineralogy Collections 90054 90053 Weathering of Igneous, Metamorphic, and Sedimentary Rocks in a Semi-Arid Climate - An Engineering Application of Petrology - This problem develops skills in X-ray diffraction analysis as applied to clay mineralogy, reinforces lecture material on the geochemistry of weathering, and demonstrates the role of petrologic characterization in site engineering.90054 90053 Teaching Guide to X-ray Diffraction at Cambridge 90054 90053 A Powerpoint presentation on use of XRD in Soil Science (PowerPoint 1.6MB Sep7 07) by Melody Bergeron, Image and Chemical Analysis Laboratory at Montana State University. 90054 90053 Brady, John B., and Boardman, Shelby J., 1995, Introducing Mineralogy Students to X-ray Diffraction Through Optical Diffraction Experiments Using Lasers. Jour. Geol. Education, v. 43 # 5, 471-476. 90054 90053 Brady, John B., Newton, Robert M., And Boardman, Shelby J., 1995, New Uses for Powder X-ray Diffraction Experiments in the Undergraduate Curriculum. Jour. Geol. Education, v. 43 # 5, 466-470. 90054 90053 Dutrow, Barb, 1997, Better Living Through Minerals X-ray Diffraction of Household Products, in: Brady, J., Mogk, D., and Perkins D. (eds.) Teaching Mineralogy, Mineralogical Society of America, p. 349-359. 90054 90053 Hovis, Guy, L., 1997, Determination of Chemical Composition, State of Order, Molar Volume, and Density of a Monoclinic Alkali Feldspar Using X-ray Diffraction, in: Brady, J., Mogk, D., and Perkins D. (eds.) Teaching Mineralogy, Mineralogical Society of America, p. 107-118. 90054 90053 Brady, John B., 1997, Making Solid Solutions with Alkali Halides (and Breaking Them), in: Brady, J., Mogk, D., and Perkins D. (eds.) Teaching Mineralogy, Mineralogical Society of America, p . 91-95. 90054 90053 Perkins, Dexter, III, and Sorensen, Paul, Mineral Synthesis and X-ray Diffraction Experiments, in: Brady, J., Mogk, D., and Perkins D. (eds.) Teaching Mineralogy, Mineralogical Society of America, p .81-90. 90054 90053 Hollecher, Kurt, A Long-Term Mineralogy Practical Exam, in: Brady, J., Mogk, D., and Perkins D. (eds.) Teaching Mineralogy, Mineralogical Society of America, p. 43-46. 90054 90053 Moecher, David, 2004, Characterization and Identification of Mineral Unknowns: A Mineralogy Term Project, Jour. Geoscience Education, v 52 # 1, p. 5-9. 90054 90053 Hluchy, M.M., 1999, The Value of Teaching X-ray Techniques and Clay Mineralogy to Undergraduates, Jour. Geoscience Education, v. 47, p.236-240. 90054 90061 .90000 Chandra X-ray Observatory Quick Facts 90001 90002 Chandra X-ray Observatory Quick Facts 90003 90002 90003 90006 Fact sheet number: 90007 FS-1999-09-111-MSFC 90008 90006 Release date: 90007 08/99 90002 NASAs newest space telescope, the Chandra X-ray Observatory, will allow scientists from around the world to obtain unprecedented X-ray images and spectra of violent, high-temperature events and objects to help us better understand the structure and evolution of our universe. 90003 90002 It will also serve as a unique tool to study detailed physics in a unique laboratory - the universe itself one that can not be replicated here on Earth.90003 90002 Managed by NASAs Marshall Space Flight Center in Huntsville, Ala., Chandra is a sophisticated, state-of-the-art instrument that represents a tremendous technological advance in X-ray astronomy. 90003 90002 90006 Did You Know? 90007 90003 90021 90022 The Chandra X-ray Observatory is the worlds most powerful X-ray telescope. It has eight-times greater resolution and will be able to detect sources more than 20-times fainter than any previous X-ray telescope. 90023 90024 90021 90022 The Chandra X-ray Observatory, with its Inertial Upper Stage and support equipment, is the largest and heaviest payload ever launched by the Space Shuttle.90023 90024 90021 90022 The Chandra X-ray Observatorys operating orbit takes it 200-times higher than the Hubble Space Telescope. During each orbit of the Earth, Chandra travels one-third of the way to the Moon. 90023 90024 90021 90022 The Chandra X-ray Observatorys resolving power is 0.5 arc-seconds - equal to the ability to read the letters of a stop sign at a distance of 12 miles. Put another way, Chandras resolving power is equivalent to the ability to read a 1-centimeter newspaper headline at the distance of a half-mile.90023 90024 90021 90022 If the State of Colorado were as smooth as the surface of the Chandra X-ray Observatory mirrors, Pikes Peak would be less than an inch tall. 90023 90024 90021 90022 Another of NASAs incredible time machines, the Chandra X-ray Observatory will be able to study some quasars as they were 10 billion years ago. 90023 90024 90021 90022 The Chandra X-ray Observatory will observe X-rays from clouds of gas so vast that it takes light more than five-million years to go from one side to the other.90023 90024 90021 90022 Although nothing can escape the incredible gravity of a black hole, not even light, the Chandra X-ray Observatory will be able to study particles up to the last millisecond before they are sucked inside. 90023 90024 90021 90022 It took almost four centuries to advance from Galileos first telescope to NASAs Hubble Space Telescope an increase in observing power of about a half-billion times. NASAs Chandra X-ray Observatory is about one-billion times more powerful than the first X-ray telescope, and we have made that leap in slightly more than three decades.90023 90024 90006 Chandra Mission at a Glance: Chandra X-ray Observatory Mission Duration 90007 90002 90006 90061 General: 90062 90007 90003 90002 90061 Chandra science mission: 90062 Approx. 5 yrs 90008 90061 Orbital Activation & Checkout period: 90062 Approx. 2 mos 90003 90002 90006 90061 Orbital Data: 90062 90007 90003 90002 90061 Inclination: 90062 28.5 degrees 90008 90061 Altitude at apogee: 90062 86,487 sm 90008 90061 Altitude at perigee: 90062 5,999 sm 90008 90061 Orbital period: 90062 64 hrs 90008 90061 Observing time per orbital period: 90062 Up to 55 hrs 90003 90002 90006 90061 Dimensions: 90062 90007 90003 90002 90061 Length (Sun shade open): 90062 45.3 90008 90061 Length (Sun shade closed): 90062 38.7 90008 90061 Width (Solar arrays deployed): 90062 64.0 '90008 90061 Width (Solar arrays stowed): 90062 14.0 90003 90002 90006 90061 Weights: 90062 90007 90003 90002 90061 Dry: 90062 10,560 lbs 90008 90061 Propellant: 90062 2,153 lbs 90008 90061 Pressurant: 90062 10 lbs 90008 90061 Total at launch: 90062 12,930 lbs 90003 90002 90006 90061 Integral Propulsion System: 90062 90007 90003 90002 90061 Liquid Apogee Engines: 90062 4 engines (Only 2 used at a time) 90008 90061 Fuel: 90062 Hydrazine 90008 90061 Oxidizer: 90062 Nitrogen tetroxide 90008 90061 Thrust per engine: 90062 105 lbs 90003 90002 90006 90061 Electrical Power: 90062 90007 90003 90002 90061 Solar Arrays: 90062 2 arrays, 3 panels each 90008 90061 Power generated: 90062 2,350 watts 90008 90061 Electrical power storage: 90062 3 batteries, 40-amp-hour, nickel hydrogen 90003 90002 90006 90061 Communications: 90062 90007 90003 90002 90061 Antennas: 90062 2 low-gain antennas 90008 90061 Communication links: 90062 Shuttle Payload Interrogator, Deep Space Network 90008 90061 Command link: 90062 2 kbs per second 90008 90061 Data downlink: 90062 32 kbs to 1024 kbs 90003 90002 90006 90061 On-board Data Capture: 90062 90007 90003 90002 90061 Method: 90062 Solid-state recorder 90008 90061 Capacity: 90062 1.8 gbs, 16.8 hrs 90003 90002 90006 90061 High Resolution Mirror Assembly: 90062 90007 90003 90002 90061 Configuration: 90062 4 sets of nested, grazing incidence paraboloid / hyperboloid mirror pairs 90008 90061 Mirror Weight: 90062 2,093 lbs 90008 90061 Focal length: 90062 33 ft 90008 90061 Outer diameter: 90062 4 ft 90008 90061 Length: 90062 33.5 in 90008 90061 Material: 90062 Zerodur 90008 90061 Coating: 90062 600 angstroms of iridium 90003 90002 90006 90061 Attitude Control & Pointing: 90062 90007 90003 90002 90061 Reaction wheels: 90062 6 90008 90061 Inertial reference units: 90062 2 90008 90061 Aspect camera: 90062 1.40 deg x 1.40 deg fov 90003 90002 90006 90061 Science Instruments: 90062 90007 90003 90002 Charged Coupled Imaging Spectrometer (ACIS) 90008 High Resolution Camera (HRC) 90008 High Energy Transmission Grating (HETG) 90008 Low Energy Transmission Grating (LETG) 90003 90002 90006 Chandra Mission at a Glance: The Inertial Upper Stage 90007 90003 90002 90006 90061 Dimensions: 90062 90007 90003 90002 90061 Length: 90062 17.0 90008 90061 Diameter: 90062 9.25 90003 90002 90006 90061 Weights: 90062 90007 90003 90002 90061 Stage 1 Dry: 90062 2,566 lbs 90008 90061 Stage 1 Propellant: 90062 19,621 lbs 90008 90061 Stage 1 - Total: 90062 22,187 lbs 90008 90061 Stage 2 Dry: 90062 2,379 lbs 90008 90061 Stage 2 Propellant: 90062 6,016 lbs 90008 90061 Stage 2 - Total: 90062 8,395 lbs 90008 90061 Total Inertial Upper Stage At launch: 90062 30,582 lbs 90003 90002 90006 90061 Performance: 90062 90007 90003 90002 90061 Thrust Stage 1: 90062 46,198 lbs, average 90008 90061 Burn Duration Stage 1: 90062 125 seconds 90008 90061 Thrust Stage 2: 90062 16,350 lbs, average 90008 90061 Burn Duration Stage 2: 90062 117 seconds 90003 90002 90006 Chandra Mission at a Glance: Support Equipment 90007 90003 90002 90006 90061 Weights: 90062 90007 90003 90002 90061 Airborne Support Equipment: 90062 5,365 lbs 90008 90061 Other: 90062 1,285 lbs 90008 90061 Total Support Equipment: 90062 6,650 lbs 90003 90002 90006 Chandra Mission at a Glance: Total Payload 90007 90003 90002 90006 90061 Weight: 90062 90007 90003 90002 90061 Total Chandra / IUS / Support equipment at liftoff: 90062 50,162 lbs 90003 90002 90006 90061 Length: 90062 90007 90003 90002 90061 Total IUS / Chandra: 90062 57.0 90003 90002 90006 More Information 90007 90003 90002 Links to the Chandra X-ray Observatory can be found at the following website: 90003 90368 http://chandra.nasa.gov/ 90003 .90000 ray - Simple English Wikipedia, the free encyclopedia 90001 90002 An X-ray photograph of a person's lungs. 90003 90004 X-radiation 90005 is a kind of electromagnetic radiation. 90004 X-rays 90005 are waves of X-radiation. X-rays have a shorter wavelength, and therefore more energy, than ultraviolet radiation. They have a much shorter wavelength than visible light (the light that we can see). Radiation with shorter wavelengths (more energy) than the X-ray is called Gamma radiation (γ-rays).These are all parts of the electromagnetic spectrum. 90008 90003 The wavelength of X-rays covers a wide range. Most X-rays have a wavelength in the range of 0.01 to 10 nanometres. This corresponds with frequencies in the range 30 petahertz to 30 exahertz (3 × 10 90010 16 90011 Hz to 3 × 10 90010 19 90011 Hz) and energies in the range 100 eV to 100 keV. 90008 90003 X-rays can go through many solid materials. For this reason, taking photograms with X-rays is used in medicine in order to see bones and other things inside the body.Sometimes the term "X-Ray" means these pictures instead of the radiation that makes them. 90008 90003 What these images show will depend on three things: Rayleigh scattering, 90010 [1] 90011 90010 [2] 90011 Compton scattering and photoabsorption. 90010 [3] 90011 The images show bone because it is dense enough that X-rays are not able to pass through it. Instead, the X-rays are either absorbed or scattered. The images do not show skin and muscle, however, because these tissues are transparent enough for the X-rays to pass through them without being absorbed too much.To detect tumors, other imaging devices are used; such as magnetic resonance imaging. A computed tomography scanner combines an X-ray machine and computer to construct a three dimensional (3D) picture. This has some ability to see other things besides bone. 90008 90003 X-rays are made by hitting metal with fast-moving electrons. They are photons, tiny packets of energy that can move atoms and change chemicals in the body. They are ionizing radiation but the things they do depend on the wavelength of the X-rays (or how much energy they have).X-rays with smaller energies ( "soft" x-rays) cause the photoelectric effect. Mid-level energies cause Compton scattering. High-level energies ( "hard" X-rays) cause pair production. X-rays used for making pictures of people have low to medium energy. Radiation therapy that treats cancer uses Compton scattering and sometimes Pair production. 90008 90003 There are small amounts of X-rays in the air. Like other energy in the air, X-rays can change living cells. Exposing the human body to high doses of X-rays for a long time is dangerous.It can cause cancer. However, cancer cells are hurt more easily, so X-rays are sometimes used to kill them. 90008 .